X-ray diffractometer D8 ADVANCE Plus

for powders

The D8 ADVANCE Plus combines maximum flexibility with unparalleled ease-of-use, perfectly matching the analytical needs of epitaxial and polycrystalline thin film, bulk and powder samples under ambient and non-ambient conditions. Thanks to TRIO optics, switching between different instrument geometries is done with the push of a button, reliably without user intervention. Unparalleled powder diffraction with Bragg-Brentano geometry Superb resolution at high intensity on epitaxial samples Optimum polycrystalline thin film diffraction in Grazing Incidence Geometry XRR to determine film thickness from 0.1 nm up to 250 nm