Optical profilometer ContourX-100

3Dwhite light interferometryroughness

Streamlined and affordable benchtop for roughness metrology ContourX-100 The ContourX-100 Optical Profilometer sets a new benchmark for accurate and repeatable non-contact surface metrology at a best-in-class price point. The small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities in a streamlined package that incorporates decades of proprietary Bruker white light interferometry (WLI) innovation. Next-generation enhancements include a new 5 MP camera and updated stage for larger stitching capabilities, and a new measurement mode, USI, for even greater convenience and flexibility for precision machined surfaces, thick films, and tribology applications. You will not find a benchtop system with better value than the ContourX-100. Industry-best Z resolution Offers constant, precision measurements, independent of magnification. Unmatched metrology value Delivers streamlined design without compromised measurement capabilities. User-friendly software interface Provides intuitive access to an extensive library of pre-programmed filters and analyses.