analysis microscope / for research / scanning probe / 3D
EIKOS series

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analysis microscope / for research / scanning probe / 3D analysis microscope / for research / scanning probe / 3D - EIKOS series
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Characteristics

  • Technical applications:

    for analysis, for research

  • Type:

    scanning probe

  • Observation technique:

    3D

Description

The Atom Probe that enables routine, high performance 3D nano-analysis for both research and industry
Building on 30 years of success in Atom Probe Tomography instrumentation and application, CAMECA has developed EIKOS™, the Atom Probe microscope for rapid alloy development and nanoscale materials research.
Product overview -

The EIKOS Atom Probe offers:

Three-dimensional tomography with nanoscale characterization of microstructures
High spatial resolution single atom detection with high efficiency
Equal sensitivity to all elements and their isotopes
Quantitative composition measurement (sub-nm to near micron scale)
Available in voltage or voltage & laser configurations
Standard specimen preparation methods

EIKOS is available in 2 configurations:

EIKOS
The base EIKOS system incorporates a reflectron design to provide excellent mass resolving power and signal to noise. A pre-aligned integrated counter electrode ensures ease of use and high reliability. The voltage pulsing system provides very high data quality on a wide variety of metallurgical applications.