analysis microscope / for research / scanning probe / 3D
for analysis, for research
The Atom Probe that enables routine, high performance 3D nano-analysis for both research and industry
Building on 30 years of success in Atom Probe Tomography instrumentation and application, CAMECA has developed EIKOS™, the Atom Probe microscope for rapid alloy development and nanoscale materials research.
Product overview -
The EIKOS Atom Probe offers:
Three-dimensional tomography with nanoscale characterization of microstructures
High spatial resolution single atom detection with high efficiency
Equal sensitivity to all elements and their isotopes
Quantitative composition measurement (sub-nm to near micron scale)
Available in voltage or voltage & laser configurations
Standard specimen preparation methods
EIKOS is available in 2 configurations:
The base EIKOS system incorporates a reflectron design to provide excellent mass resolving power and signal to noise. A pre-aligned integrated counter electrode ensures ease of use and high reliability. The voltage pulsing system provides very high data quality on a wide variety of metallurgical applications.