- Metrology - Laboratory
- Laboratory Equipment
- X-ray microscope
- ZEISS Industrial Metrology
X-ray microscope ZEISS Xradia 810 Ultra3D
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Characteristics
- Type
- X-ray
- Observation technique
- 3D
- Resolution
50 nm
Description
Xradia 810 Ultra increases the throughput of nanoscale, three-dimensional X-ray imaging by up to a factor of 10. This innovative X-ray microscope (XRM) operates at 5.4 keV, a lower energy that delivers better contrast and image quality for medium to low Z samples and other materials used throughout science and industry.
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