SmartPI (Smart Particle Investigator) is an automated particle analysis and classification solution for scanning electron microscopes. SmartPI turns SEMs into turnkey solutions for industrial cleanliness or metal and steel applications. SmartPI incorporates all aspects of SEM control, image processing and elemental analysis (EDS) within a single application.
- Control both SEM imaging and EDS analysis with one software program.
- Run automated, unattended particle analyses.
- Generate repeatable data and industry-standard compliant reports.
- Combine SmartPI with ZEISS light microscope particle analysis solutions to configure a correlative workflow.
- SmartPI is compliant with ISO 16232 and VDA 19 cleanliness standards.