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  4. Carl Zeiss Industrielle Messtechnik GmbH

FIB focused ion beam probe ZEISS Crossbeam 340 & 540

FIB focused ion beam probe
FIB focused ion beam probe
FIB focused ion beam probe
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FIB

Description

The ZEISS Crossbeam 340 and Crossbeam 540 are FIB-SEMs indicated for nanotomography and nanofabrication. Using Crossbeam, imaging and analytical performance of the GEMINI column can be linked for sample preparation and material processing under a nanoscopic scale. Your low kV SEM performance can be combined with FIB currents up to 100 nA to speed up the nanotomography and nanofabrication. It has an easy-to-understand graphical user inerface and users can benefit from a maximum stability and a standard beam profile, making the device more reliable during complicated and long experiments.

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