Product nameViper
TaglineWaveform digitizer with automated glitch and transient detection
Reasons Why- VIPER embeds software tools, calibration and diagnostics
- VIPER analyses and detects DUT waveform glitches and transients
- Designed for characterization test benches and mass-production test cells
OverviewViper is a massive-parallel high-speed voltage measurement system
- Scalable from 32 to thousands of channels
- Flags locations in the test program of extreme events
Requirement to measure Contact Resistance- Current measurement is intrusive and requires changing the path from tester to DUT
- Voltage measurement can be added on existing loadboards by adding wires/traces
New method to identify contact resistance issues by only measuring less intrusive voltages- Identify where in the test program excessive current is used
- Can be added to existing setups to debug issues
- No need to redesign interface boards or probe cards
Features (from specifications)- Dimensions (D×W×H): 405 mm × 440 mm × 45 mm
- Measurement instruments: AWG / TMS / Differential Voltage Meter
- Up to 192 channels per unit (6×32 channels waveform capture / digitizer)
- Differential input with independent AGND
- Programmable sample rate up to 100 Msps
- Up to 14 bits resolution
- Independent ranges per channel — 2 input ranges: ±7.5 V and ±75 V
- 1 GByte shared capture memory
- Digital trigger per channel
- Hardware sync / trigger
Technical specifications- Model name: Viper
- Function: Massive-parallel high-speed voltage measurement and waveform digitizer with automated glitch and transient detection
- Channels: scalable from 32 up to thousands; instrument capture up to 192 channels (6×32) per unit
- Input: Differential inputs with independent AGND
- Sample rate: Programmable up to 100 Msps
- Resolution: Up to 14 bits
- Input ranges: Two independent ranges per channel — ±7.5 V and ±75 V
- Memory: 1 GByte shared capture memory
- Triggering: Digital trigger per channel; hardware synchronization/trigger
- Form factor / Dimensions: 405 mm × 440 mm × 45 mm
- Applications: Characterization test benches, mass-production test cells, contact resistance detection and debug in existing tester setups