safety light curtain / multibeam / through-beam / rugged
Type of beam:
di-soric high performance light curtains are used for the safe detection of silicon fragments on wafers and to detect double layers of wafers.
The early ejection of faulty wafer material from the production process reduces the reject rate. These light curtains can be adapted to the different wafer sizes and thanks to the compact design also be mounted in narrow spaces. Sturdy metal casings and high protection class are further features of these light curtains.
Reliable detection of double layers and fragments larger 10 mm
Electronic potentiometer for adjusting wafer thickness and fragment size
Input for switching between wafer sizes 125 mm and 156 mm
High protection class