Electric test probe ICT/FCT series

ICT / FCT

FEINMETALL offers a wide range of finest contact probes, up to the limits - and beyond. While ICT (in-circuit test) contact probes are used to test components, FCT (functional test) contact probes can be used to test entire assemblies. ICT Contact Probes During in-circuit testing (ICT), each component of an electronic assembly is checked for faults. Short circuits, interruptions, soldering or component faults are detected and assemblies are rejected according to a go/no-go test. FCT Contact Probes During functional testing (FCT), the assemblies are tested completely or in partial areas for the intended operation. The function test of the modules is carried out in the end application or in an environment that simulates the end application. Advantages, you benefit from Increased first pass yield (FPY) Longer life cycle Low contact resistance Constant (low) contact resistance over life time Reduced maintenance time and costs Easy mounting and replacement with suitable tools Applications of ICT / FCT Contact Probes Applications for ICT/FCT Contact Probes Assembled and Bare Printed Circuit Boards Test equipment for assembled standard PCBs, multilayer and other special PCBs as well as unassembled PCBs (bare board). Standard Contacting of Pins, Pads and Vias Test equipment for all types of devices under test (DUT) such as component pins, solder pads, vias and others. Single and Dual Stage Contacting Range of different lengths of test equipment for single and dual stage contacting as well as for compensating other height differences.