Resistance probe T-Wave

Industry-leading performance for on-wafer measurement of millimeter and submillimeter wavelength devices. The T-Wave Probes set the industry performance standard for characterization of mmWave devices. This probe delivers low insertion loss and low contact resistance when probing gold pads. Excellent tip visibility. Ability to characterize 1.1 THz devices. Typical Insertion loss < 1.5 dB between 140 GHz and 220 GHz. Integrated DC bias-T with low-profile GPPO connector.