Time-of-flight image sensor S15454-01WT
NIRhigh-sensitivitycompact

time-of-flight image sensor
time-of-flight image sensor
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Characteristics

Technology
time-of-flight
Spectrum
NIR
Other characteristics
high-sensitivity, compact

Description

NIR-enhanced type measures the distance to an object by TOF (Time-Of-Flight) method The distance image sensor is designed to measure the distance to an object by TOF method. When used in combination with a pulse modulated light source, this sensor outputs phase difference information on the timing that the light is emitted and received. Distance data can be obtained by performing calculation on the output signal with an external signal processing circuit or on a PC. We provide an evaluation kit for this product. Contact us for detailed information. Features -High sensitivity in the near infrared region -Improved tolerance to background light Compact wafer level package (WLP) type Specifications Type : NIR-enhanced type Image size : 4.8 x 3.6 mm Number of effective pixels : 96 x 72 Pixel pitch : 50 μm Pixel height : 50 μm Spectral response : 500 to 1100 nm Peak sensitivity wavelength : 800 nm Video data rate : 10 MHz Note : Typ., Ta=25 ℃, Vdd(A)=Vdd(D)=3.3 V, unless otherwise noted

Exhibitions

Meet this supplier at the following exhibition(s):

ACHEMA 2024
ACHEMA 2024

10-14 Jun 2024 Frankfurt am Main (Germany) Hall 11.1 - Stand F62

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    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.