Analysis microscope HD-2700
scanning transmission electrondigital camerahigh-resolution

analysis microscope
analysis microscope
analysis microscope
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Technical applications
for analysis
scanning transmission electron
Other characteristics
digital camera, high-resolution, high-speed

Max.: 0.144 nm

Min.: 0.136 nm


The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With the option for a probe-forming aberration corrector, ultra-high resolution can be achieved for both STEM and SE imaging. The Hitachi corrector minimizes the user's effort in doing aberration correction. Large solid-angle EDS* and atomic-spatial-resolution EDS* and EELS spectrum imaging* are enabled. Features High-resolution STEM imaging HAADF-STEM image 0.136 nm, FFT image 0.105 nm (HR lens*) BF STEM image 0.204 nm (w/o Cs-corrector) High-speed & high-sensitivity EDX analysis: Probe current × 10 times Timely and rapid elemental mapping Low-concentration element detection Hitachi-developed Cs-corrector Equipped with a probe-forming spherical aberration corrector developed by Hitachi, the automatic aberration-correction process takes a short time and does not require prior experience for aberration correction. Seamless solution from sample preparation to observation & analysis Holder compatible with Hitachi FIB *:Optional accessory


*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.