Field emission scanning electron microscope SU5000
for analysis3Din-situ

field emission scanning electron microscope
field emission scanning electron microscope
field emission scanning electron microscope
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Characteristics

Type
field emission scanning electron
Technical applications
for analysis
Observation technique
BF-STEM, 3D, DF-STEM, in-situ
Configuration
floor-standing
Electron source
Schottky field emission
Detector type
secondary electron, back-scattered electron
Options and accessories
computer-assisted
Other characteristics
for nanotechnology, high-resolution, automated, variable pressure scanning, for flat samples, for polished samples, topography, asbestos identification, simultaneous acquisition, earth sciences, high-magnification
Resolution

1.2 nm

Description

Innovative analytical FE-SEM allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is a knowledge-based system for SEM imaging that goes beyond basic preset conditions and recipes. Its ease of use opens a new gateway for material research, development, and area beyond our imagination. The SU5000 FE-SEM has forever changed SEM operations. Ground-breaking computer-assisted technology from Hitachi, referred to as the EM Wizard, offers a new level of SEM operation and control. Expert or novice, the result is now the same: Highest quality nano-scale images at everyone's fingertips! • A novel, revolutionary user interface, EM Wizard, provides all users with optimum levels of resolution, repeatability, and throughput. With EM Wizard, beginners become experts overnight. • Automatic axis adjustment technology (auto-calibration) restores the microscope to its "best condition" on demand. • A robust "draw-out" specimen chamber accommodates large specimens (-200 mmφ, -80 mmH). • Rapid sample exchange with evacuation to observation in 3 minutes or less. • Automated, intuitive on-demand image optimization on the fly. • A visual and interactive guide offers 'pick and choose' SEM modes to ensure best operating conditions. • With the 3D MultiFinder tool, samples are easily tilted and rotated with the image remaining centered and in focus. Multiple angle information from a newly developed annular Backscatter Electron Detector (BSD) acquires both topographic and compositional information simultaneously.

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Exhibitions

Meet this supplier at the following exhibition(s):

36th Control 2024
36th Control 2024

23-26 Apr 2024 Stuttgart (Germany) Stand 7103

  • More information
    The Advanced Materials Show

    15-16 May 2024 Birmingham (United Kingdom)

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    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.