Field emission scanning electron microscope SU7000

for analysisBF-STEMDF-STEM

The modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous multi-signal collection. The SU7000 is designed to address these aspects and more by delivering enhanced information for diversified needs in the field of electron microscopy. Experience the nano-world with the SU7000! Versatile Imaging Capability The SU7000 excels in fast acquisition of multiple signals to address expansive SEM needs, from imaging a wide field of view to visualizing sub-nanometer structures and everything in between. The incorporation of newly designed electron optics and detection systems allows for efficient simultaneous acquisition of multiple secondary electron and back-scattered electron signals. Multi-Channel Imaging The number of the detectors mounted on the SEM is ever increasing, along with the need to display all collected information effectively. The SU7000 is capable of processing, displaying, and saving up to 6 signals simultaneously to maximize information acquisition. Wide Variety of Observation Techniques The specimen chamber and the vacuum system are optimized for: • Large specimen size • Sample manipulation at various axes • Variable pressure conditions • Cryogenic conditions • Heating and cooling in-situ observation