analysis microscope / optical / upright / 3D
MI4050

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analysis microscope / optical / upright / 3D analysis microscope / optical / upright / 3D - MI4050
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Characteristics

  • Technical applications:

    for analysis

  • Type:

    optical

  • Ergonomics:

    upright

  • Observation technique:

    3D

  • Other characteristics:

    high-definition

Description

The MI4050 High-Performance Focused Ion Beam System is equipped with new optics and provides the world-leading SIM imaging resolution and high-definition TEM sample preparation with improved imaging resolution at low kV. The MI4050 accommodates a variety of applications such as cross-section observation, circuit modification, vector scan processing, nano-micro patterning, nano molding, and 3D nano fabrication using deposition function.