The Waveline Map 3D analysis software allows you to capture specific profile and surface data on your workpieces — in addition to the roughness measurement.
The Waveline measuring systems from Jenoptik can be used for roughness or contour measurement. We also offer systems that combine both of these functions. The Waveline T8000, Surfscan and Nanoscan Jenoptik measuring systems can be expanded with 3D analysis software for topography. The Waveline Map software allows you to render the surface texture of workpieces as a graphic for evaluation.
Waveline Map is intuitively designed and is easy to operate. Measured data, for example, can be pre-processed with respect to alignment, filtering and form removal. Automatic recalculations are performed as soon as the evaluation steps change. The system provides extensive metrological and scientific filtering options.
The 3D analysis software is available in three versions: Basic, Expert and Premium. The Expert and Premium versions meet the ISO/TS 25178 standard for 3D parameters.
In addition to software, a Y positioning table is also required for topography measurements. This facilitates the necessary workpiece movement. The tables can hold components of up to 30kg in weight, and work with a guide accuracy of approximately 5μm.
Flexible: Can be used at measuring stations for roughness measurement where necessary
Simple: Intuitive software is easy to use
Fast: Automatic recalculations after changes to evaluation steps
Modular: Three versions that build on each other
Automotive industry: Measurement of 3D parameters on workpiece surfaces