Electron probe microanalyzer (EPMA) JXA-8230

The EDS, which is a versatile and easy-to-use X ray detector, can be mounted. A combined WDS snd EDS system provides a seamless and user-friendly environment for analysis. JEOL has developed a new EPMA(Electron Probe Microanalyzer), that continues a long history of EPMA development extending over neary a half century.  The JXA-8230, designed for user-friendly operations, provides for a complete range of analyses through a new, simple to use, PC-based interface.  The high-accuracy and fast speeds offered by the JXA-8230 are a result of its sophisicated hardwre developed from JEOL's EPMA technologies refined over neary 50 years.  The JXA-8230 is powerful, next-generation, analytical tool that fully meets all of the requirements of an EPMA. EPMA quick start Click any point and then an analysis type to start a preset qualitative or quantitative ED or WD analysis User recipes Save or recall a frequently used set of analytical conditions for a variety of different sample types.  All column, EDS and WDS parameters are included in the recipe. EDS Capabilities Digital pulse processor Spectral mapping (WD/ED, stage and beam scanning) Fan free SDD (option) Application JXA-8230 Chemical State Analyses by Soft X-ray Emission Spectroscopy Analysis of Cracks in Brass Piping Parts LIBnote Image Processing Techniques for Mapping Beam size and X-ray emitting area JXA-8230 Electron Probe Micro Analyzer