3-axis CNC milling machine JIB-4000PLUS

universalopticalcompact

The JIB-4000PLUS is a focused ion beam milling & imaging system (single-beam FIB system) featuring a high-performance ion optical column. The accelerated Ga (gallium) ion beam is focused onto a specimen to enable SIM image observation of the specimen surface, milling, and deposition of materials like carbon or tungsten. The system also enables preparation of a thin-film specimen for TEM imaging and a cross-section specimen for observing the interior of the specimen. In addition, the JIB-4000PLUS can be equipped with a 3D observation function and an automatic TEM specimen preparation function; thus the system meets a variety of needs for specimen preparations. Features High-Power FIB column The JIB-4000PLUS incorporates a High-Power FIB column with a maximum ion beam current of 60 nA. Furthermore, the system can increase a beam current up to 90 nA (optional) for shortening the specimen preparation time and broadening the specimen preparation area. The JIB-4000PLUS enables a short time preparation of a cross section with a diameter exceeding 100 μm. User-friendly FIB The JIB-4000PLUS offers excellent operability of a High-Power FIB column. The design concept of the system is user-friendliness, with the external appearance as well as the GUI designed for simple operation of the system even for novice users. The compactness of the system, smallest class in the industry, achieves a small footprint for a wider range of selections for the installation site.