Product name TWE Tester (JPT)
Overview The JPT TWE Tester is a module tester designed for laser modules and high-precision automated optical inspection systems. It addresses testing needs across the product lifecycle, from R&D verification to mass-production quality control.
Category Intelligent Equipments / Module Tester
Applications - Testing and characterization of laser modules
- High-precision automated optical inspection
- R&D validation and production-line quality control
Key features - Wavefront measurement using a Shack–Hartmann sensor architecture
- High phase resolution (<4 nm RMS) and absolute accuracy (~10 nm RMS)
- Wavelength coverage for broadband testing (400–1100 nm)
- Modular, compact design with quick-change holder system to accommodate different parts
- Non-contact, high-speed acquisition with repeatable results and real-time processing
- Multi-band switching and customizable report output via integrated software
Technical specifications - Wavelength range: 400-1100 nm
- Measurement aperture: 5.02 mm × 3.75 mm
- Phase space resolution: 27.6 μm – 77.28 μm (depending on beam expander)
- Phase resolution: <4 nm RMS
- Absolute accuracy: 10 nm RMS
- Acquisition frequency: 60 fps
- Real-time processing: 10 fps (full resolution)
- Interface: Gigabit Ethernet
- Local/component weight: ~400 g
- Machine weight: 1000 kg
- Loading mode: Manual loading/unloading; manual slide with quick-change holder system
- Power: AC 220 V, 50 Hz; Power consumption: 1.5 KW; Rated current: 6.8 A
- Air supply: φ10; 0.5–0.7 MPa
- Overall dimensions: 910 mm × 12500 mm × 2040 mm
Use cases - Imaging quality and aberration assessment of optical components for consumer electronics
- Production testing and quality control for planar and lens-type optical parts
- Multi-band optical characterization and generation of customized reports
Reference - Brand: JPT
- Product: TWE Tester
- Product family: Module Tester
- Source page: https://en.jptoe.com/products/intelligent-equipments/module-tester/twe-tester