Optical pyrometer CellaWafer PA 38
digital°C°F

Optical pyrometer - CellaWafer PA 38 - Keller Pyrometer Systems - digital / °C / °F
Optical pyrometer - CellaWafer PA 38 - Keller Pyrometer Systems - digital / °C / °F
Optical pyrometer - CellaWafer PA 38 - Keller Pyrometer Systems - digital / °C / °F - image - 2
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Characteristics

Technology
optical
Display
digital
Units of measurement
°C, °F
Communication
USB
Configuration
stationary
Applications
for metals, for semiconductors
Other characteristics
stainless steel, precision
Temperature

Min.: 450 °C
(842 °F)

Max.: 1,800 °C
(3,272 °F)

Spectral range

0.88 µm

Response time

2 ms, 50 ms

Description

Product overview:
The CellaWafer PA 38 is a digital pyrometer for non‑contact temperature measurement of wafers and metals in the range 450 to 1800 °C. Its very short‑wave, narrow‑band spectral response makes it ideal for silicon wafer processing (e.g. RTP) and for metals such as tungsten and molybdenum. The sensor design reduces sensitivity to changes in target emissivity, enabling more stable readings in production environments.

Special features:
  • Measuring range 450 to 1800 °C
  • Focusable interchangeable lenses for precise adjustment of measuring distance
  • Broadband anti‑reflective precision optics
  • Short‑wave, narrow‑band spectral range (0.88 µm)
  • Optimized for precise measurements on silicon wafers and metals
  • High‑visibility 4‑digit LED display, readable from distance
  • Test current output for diagnostic functions
  • Standard interfaces: analogue output plus USB and RS‑485


Selectable properties / typical configuration:
  • Measuring range: 450 – 1800 °C
  • Focus distance examples: 0.3 m – ∞ (lens dependent)
  • Sighting options: through‑the‑lens sighting / integrated video camera / laser pilot light
  • Example version: CellaWafer PA 38 AF 10


Scope of delivery (typical):
  • Pyrometer CellaWafer PA 38
  • Connection cable VK 02/A (5 m)
  • Video cable VK 02/F (5 m) for models with built‑in camera
  • USB cable VK 11/D (1.8 m)
  • Software CellaView
  • Short manual


Notes / tools available on product page:
  • Measuring field calculator (examples of spot diameters vs. distance)
  • Emissivity calculator and functions for setting emissivity
  • Video demonstration of the camera option


Technical specifications (selection):
  • Item No.: 1124957
  • PGB no.: 500
  • Measuring principle: single‑colour (one‑colour)
  • Measuring range: 450 – 1800 °C
  • Spectral range: 0.88 µm
  • Sensor: photodiode
  • Response time t98: ≤ 50 ms (T > 650 °C); ≤ 2 ms (T > 850 °C)
  • Measurement uncertainty: 0.3 % of reading, min. 4 K
  • Repeatability: 1 K
  • Distance ratio (D:S): 60 : 1
  • Shape of measuring field: round
  • Example objective/lens: PA 20.08 (e.g. F50 PZ 20.08 — focus 0.3 m – ∞)
  • Analog output: 0(4) – 20 mA, linear, switchable, scalable; R ≤ 500 Ω
  • Analog input: 0 – 10 V
  • Switching outputs: 2 × open collector 24 V DC, ≤ 30 mA
  • Switching inputs: 2 × up to 24 V
  • Interfaces: USB, RS‑485
  • Power supply: 24 V DC (+10 % / −20 %); current consumption ≤ 175 mA
  • Video output (camera option): composite PAL
  • Display: 4‑digit red LED, digit height 8 mm; status display: 2 × LED; control: 3 buttons
  • Connection: M12, 8‑pin
  • Ambient temperature (operation): 0 – 65 °C; storage: −20 – +80 °C
  • Permissible humidity: max. 95 % r.H. (non‑condensing)
  • Housing: stainless steel V2A (1.4305); protection class: IP65
  • Dimensions: Ø 65 mm × 220 mm (max. 277 mm); weight: approx. 0.9 kg
  • Adjustable parameters (examples): measuring range, analogue I/O scaling, smoothing filter, emissivity/transmittance, reflected ambient radiation compensation, alarm limits, linearization, LED behavior, simulation modes, unit °C/°F; camera models: TBC, white balance
  • Functions (examples): overtemperature alarm (analogue output > 20.5 mA if internal temp > 80 °C), service/value simulation, ATD (Automatic Temperature Detection) for discontinuous processes
  • Software: CellaView

Exhibitions

Meet this supplier at the following exhibition(s):

HärtereiPraxis 2026
HärtereiPraxis 2026

22-24 Jun 2026 Kamp-Lintfort im Wellings Parkhotel (Germany)

Shenzhen International Semiconductor & IC Exhibition
Shenzhen International Semiconductor & IC Exhibition

9-11 Sep 2026 Shenzhen (China)

*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.