Hardness test indenter Nano Indenter® G200X

The Nano Indenter G200X provides an easy-to-use nanoscale mechanical tester that quickly delivers accurate, quantitative results. The G200X system includes our highest performing motion system, largest sample mounting system and our high-resolution optical microscope. Our InView software, iQWave2 controller and InForce actuators deliver the same high performance results across the product line up. The G200X system options include the continuous stiffness measurement (CSM), scanning probe microscopy, scratch testing, frequency sweeps, electrical measurements, high speed testing and impact testing. Features Electromagnetic actuator to achieve the high dynamic range in force and displacement High resolution optical microscope and precision XYZ motion system for viewing, positioning and targeting samples. Easy mount sample tray with multiple sample positions for high throughput testing. Modular options for testing beyond indentation for SPM imaging, scratch testing, high temperature nanoindentation measurements, dynamic testing (CSM) and high-speed testing. Intuitive interface for quick test setup; testing parameters can be changed with just a few mouse clicks Real-time experimental control, easy test protocol development and test setup. Full suite of InView software including ReviewData and InFocus for analyzing data and creating reports. Award-winning, high-speed testing for material property maps and increased statistical confidence. iQWave2 high-speed controller electronics with 100kHz data acquisition rate and 16µs time constant. Applications High speed hardness and modulus measurements (Oliver-Pharr)