OverviewThe Specim SX25 is a short-wave infrared (SWIR) hyperspectral camera designed for material analysis in research, laboratory and industrial environments. It operates across 960–2500 nm, provides 640 spatial pixels, selectable up to 392 spectral bands with 8 nm spectral resolution, and a signal-to-noise ratio of 1500:1, enabling capture of closely spaced spectral features with high spectral fidelity and consistent data quality.
Features- Spectral range 960–2500 nm — SWIR coverage for material identification
- Up to 392 selectable spectral bands — adaptable spectral sampling
- 8 nm spectral resolution — detailed spectral discrimination
- 640 spatial pixels — high spatial sampling for imaging
- Signal-to-noise ratio 1500:1 — improved detectability of subtle features
- GigE Vision interface — standardised data transfer and system integration
- Flexible high-quality optics — lens options and adjustable working distance from wide area to macro imaging
- Built-in image enhancement — reduces required post-processing
- Unified spectral calibration — consistent and comparable data across units
ApplicationsSuitable for coating layer inspection, mineral and ore classification, food quality and contamination inspection, agricultural and pharmaceutical research, cultural heritage analysis and other material-characterisation tasks where spatial accuracy and spectral detail are required.
Technical specifications- Spectral range: 960–2500 nm
- Spatial pixels: 640
- Spectral bands: Up to 392 selectable bands
- Spectral resolution: 8 nm
- Signal-to-noise ratio: 1500:1
- Interface: GigE Vision
- Optics: Flexible high-quality lens options; adjustable working distance (wide area to macro imaging)
- Image processing: Built-in advanced image enhancement to reduce post-processing
- Calibration: Unified spectral calibration for consistent data across units