Analysis microscope DCM8
for researchmeasuringinspection

analysis microscope
analysis microscope
analysis microscope
analysis microscope
analysis microscope
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Technical applications
for analysis, for research, measuring, inspection
benchtop, upright
Observation technique
bright field, 3D, confocal, nanoscope
Other characteristics
real-time, USB, digital camera, LED illumination, with profiler function, for in-line wafer inspection, high-resolution, automated, with height ajustment, ergonomic, for flat samples, topography, ultra-high resolution, high-speed, movable objective, for thin-film measurements, modular, depth measurement, with white light interferometry-based metrology system, high-precision, for quality control, for nanotechnology, high-definition, 3-axis, computerized, for polished samples, high-contrast, with coaxial illumination, image-processing, with light intensity manager, for wafers, for semiconductors, high-magnification, 3-axis non-contact measuring, multipurpose, for integration microscope and profilometer


3D Optical Surface Metrology System Leica DCM8 Designed to help you maximize efficiency, Leica DCM8 unites the advantages of High Definition confocal microscopy with interferometry into one versatile, dual-core system. Ultra-fast analysis is ensured thanks to one-click mode selection, sophisticated software and HD confocal scanning without moving parts. Get the Best Accuracy and Repeatability Whether you are working in production or research, the Leica DCM8 delivers the accurate, repeatable metrological analysis results you need in order to optimize material performance. Does your surface have steep slopes or complex shapes? Achieve vertical resolution up to 2 nm withHD confocal microscopy. Is your surface smooth with micro peaks and valleys? Choose from three interferometry modes: Vertical Scanning Interferometry (VSI), Phase Shift Interferometry(PSI) or extended PSI (ePSI) for resolution of up to 0.1 nm. And, if you need a quick, brilliant HD 2D image, the Leica DCM8 offers brightfield and darkfield modes. Capture Surface Data Quickly The Leica DCM8 employs innovative HD microsdisplay scanning technology. With no moving parts in the sensor head, fast and reproducible data capture is guaranteed. The integrated HD CCD camera has a large Field Of View allowing more of your sample surface to be analyzed at once. To obtain a seamless, precise model of an even larger surface area, simply select the ultra-fast XYtopography stitching mode.


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