Imaging analysis system JF-2

imaging analysis system
imaging analysis system
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Description

JF-3 model X-ray Crystal Analysis Instrument Laue Camera and High Precision Orientation Function: Camera:Using the Laue camera, the film is mounted between the crystal and the X-ray source, the incident beam is passed through a small hole in the film, which is recorded to the rear upward diffraction beam, and the direction of the diffraction beam is used to measure the shape and size of the crystal cells in the unknown crystals to determine the orientation of the crystals and to evaluate the perfection of the crystals. Orientation: The precision orientation for the crystal material, takes use of X-ray passed through front Monochromator, the diffraction ray is irradiated to the sample after being monochromatic,,which accords with the nλ=2dsinθ of the formula, which is enlarged by the counting tube, and the angle value is read by the meter display intensity. Main parameter: Power: AC220V 50Hz 30A Power: 2KW X-ray tube: Cu target Tube voltage: 50KV( adjustable) Tube Current: 50mA( adjustable) Photography: Camera: Back reflex, Laue camera Camera mode: Automatic timing (Countdown) Timing Time: (1 seconds ~9999 seconds) Orientation: Mode: High precision (front monochromator) Measuring angle Range: θ 10°~50°, 2θ 10°~100° Display: Digital display, degrees, minutes, seconds Display accuracy: 1″ Light Gate: pedal Electromagnetic Light brake Resolution: ±15″ (Superior)
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