Thickness measuring instrument
basis weightX-raybackscatter

thickness measuring instrument
thickness measuring instrument
thickness measuring instrument
thickness measuring instrument
Add to favorites
Compare this product
 

Characteristics

Measured value
thickness, basis weight
Technology
X-ray, backscatter
Applications
for the textile industry, for paper, for extrusion lines
Other characteristics
high-precision

Description

Measure Thickness and Basis Weight NDC’s X-Ray Backscatter gauges are designed to provide measurement performance that meets or exceeds the exacting requirements of plastics extrusion, converting, calendering, paper, nonwovens and textile applications. • Excellent Cross-Web Resolution – for more precise profile control • High Accuracy Performance – specifically tuned to obtain maximum sensitivity and high-accuracy performance across a wider operating weight/thickness range than comparable nuclear gauges • High Stability and Sensitivity – precisely regulated high-voltage supply provides excellent measurement stability, and adjustment of the high voltage ensures optimum sensitivity for a given application • Non-Nuclear – requires minimal shielding due to low photon energies, presents no residual radiation hazard when the unit is powered down and does not require nucleonic licensing for simplified installation • Fast ROI and Lowest Cost of Ownership – robust, cost-effective measurement solution that is highly reliable and easy to maintain • Preeminent Support – all systems are backed by NDC's dedicated worldwide customer service organization available 24-7 via myNDC cloud service

Catalogs

No catalogs are available for this product.

See all of NDC Technologies‘s catalogs
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.