Research microscope JCM-7000 Neoscope
for analysisbiomedicalmeasuring

research microscope
research microscope
research microscope
research microscope
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Technical applications
for research, for analysis, biomedical, measuring, educational, inspection, industrial, metallurgical, for materials research, medical, gemological
scanning electron
benchtop, upright, compact
Observation technique
Other characteristics
automated, zoom, high-resolution, with variable inclination, fiber optic inspection, for polished samples, for wafers, 3-axis, high-speed, image capture, ultra-high resolution, with tilt observation, asbestos identification, for nanoindentation hardness, high-definition, depth measurement, for quality control, low-temperature, modular, with height ajustment, motorized, for nanotechnology, topography, alignment, for non-metallic inclusion inspection, long working distance, high-magnification, with profiler function, ergonomic, image-processing, for thin-film measurements, computerized, variable pressure scanning, real-time, variable temperature, high-precision, for semiconductors, high-contrast, multipurpose, cost-effective

Min.: 10 unit

Max.: 60,000 unit


The latest in benchtop SEM technology, the JCM-6000Plus "NeoScopeTM," is a touch panel controlled, multi functional desktop scanning microscope that answers the increasingly diversified needs among users worldwide. The JCM-6000Plus is equipped with the high-sensitivity semiconductor detectors found in high-end instruments, making it easy to acquire composition contrast information about the specimen, and enabling efficient analysis. The series continues to include the high-vacuum functionality and secondary electron detector, offering the ability to clearly observe fine structures on the specimen surface at high magnification. Main features of the JEOL JCM-6000plus Automatic image formation after sample introduction within 3 minutes High resolution (60,000X) and large depth of field Multi-touch screen interface for intuitive operation Advance automatic functions (focus, stigmation, brightness/contrast) High and low vacuum modes Three selectable accelerating voltages Secondary electron and solid state backscattered electron detector Large sample coverage (up to 70 mm diameter) Options include: motor drive stage and EDS



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