Scanning electron microscope JCM-7000
for researchfor analysisbiomedical

scanning electron microscope
scanning electron microscope
scanning electron microscope
scanning electron microscope
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Characteristics

Type
scanning electron
Technical applications
for research, for analysis, biomedical, measuring, educational, inspection, industrial, metallurgical, for materials research, medical, gemological, for quality control, for non-metallic inclusion inspection, for thin-film measurements, multipurpose, depth measurement
Ergonomics
upright
Observation technique
nanoscope
Configuration
compact, benchtop
Other characteristics
automated, zoom, high-resolution, with variable inclination, fiber optic inspection, for polished samples, for wafers, 3-axis, high-speed, image capture, ultra-high resolution, with tilt observation, asbestos identification, for nanoindentation hardness, high-definition, low-temperature, modular, with height ajustment, motorized, for nanotechnology, topography, alignment, long working distance, high-magnification, with profiler function, ergonomic, image-processing, computerized, variable pressure scanning, real-time, variable temperature, high-precision, for semiconductors, high-contrast, cost-effective
Magnification

Max.: 60,000 unit

Min.: 10 unit

Description

JEOL NeoScope JCM-7000 SEM The JCM-7000’s highly-advanced auto functions, stage automation, and software enable easy sample imaging and elemental analysis for users of all experience levels. Equipped with a large sample chamber, both high and low vacuum modes of operation, both secondary and backscatter electron detectors (SED & BSED), real-time 3D imaging, easy to use metrology tools and optional fully-integrated EDS. The JCM-7000 NeoScope is SMART – FLEXIBLE - POWERFUL. SMART– FLEXIBLE – POWERFUL Smart – The latest innovations are built in to the benchtop platform to make SEM accessible to everyone. All the controls are at the user's fingertips through an intuitive software interface. Automatic condition setting is based on sample type and application for image formation in minutes. Seamless navigation from the holder graphic or optical image (option) to high resolution SEM image enhances productivity. Flexible – Choose the right platform. Add options such as the Stage Navigation System (color camera), Tilt Rotation Motorized Holder for sample manipulation, fully-embedded EDS for elemental analysis and Smile View Map for 3D image reconstruction and surface texture analysis. Powerful – High resolution Tungsten (W) filament source allows magnification up to 100,000X. Large analytical chamber can handle samples as large as 80mm (D) x 50mm (H). Secondary and backscatter electron detectors along with high and low vacuum modes of operation allow for the study of a wide variety of sample types. The BSE detector supports live 3D imaging for intuitive knowledge of sample surface shape.

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