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Research microscope JCM-7000 Neoscope
for analysisbiomedicalmeasuring

research microscope
research microscope
research microscope
research microscope
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Characteristics

Technical applications
for research, for analysis, biomedical, measuring, educational, inspection, industrial, metallurgical, for materials research, medical, gemological
Type
scanning electron
Ergonomics
benchtop, upright, compact
Observation technique
nanoscope
Other characteristics
automated, zoom, high-resolution, with variable inclination, fiber optic inspection, for polished samples, for wafers, 3-axis, high-speed, image capture, ultra-high resolution, with tilt observation, asbestos identification, for nanoindentation hardness, high-definition, depth measurement, for quality control, low-temperature, modular, with height ajustment, motorized, for nanotechnology, topography, alignment, for non-metallic inclusion inspection, long working distance, high-magnification, with profiler function, ergonomic, image-processing, for thin-film measurements, computerized, variable pressure scanning, real-time, variable temperature, high-precision, for semiconductors, high-contrast, multipurpose, cost-effective
Magnification

Min.: 10 unit

Max.: 60,000 unit

Description

The latest in benchtop SEM technology, the JCM-6000Plus "NeoScopeTM," is a touch panel controlled, multi functional desktop scanning microscope that answers the increasingly diversified needs among users worldwide. The JCM-6000Plus is equipped with the high-sensitivity semiconductor detectors found in high-end instruments, making it easy to acquire composition contrast information about the specimen, and enabling efficient analysis. The series continues to include the high-vacuum functionality and secondary electron detector, offering the ability to clearly observe fine structures on the specimen surface at high magnification. Main features of the JEOL JCM-6000plus Automatic image formation after sample introduction within 3 minutes High resolution (60,000X) and large depth of field Multi-touch screen interface for intuitive operation Advance automatic functions (focus, stigmation, brightness/contrast) High and low vacuum modes Three selectable accelerating voltages Secondary electron and solid state backscattered electron detector Large sample coverage (up to 70 mm diameter) Options include: motor drive stage and EDS

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