analysis microscope / for research / inspection / scanning electron
JCM-6000Plus

{{requestButtons}}

Characteristics

  • Technical applications:

    for analysis, for research, inspection

  • Type:

    scanning electron

  • Ergonomics:

    benchtop

  • Other characteristics:

    high-resolution, high-magnification

  • Magnification:

    Min.: 10 unit

    Max.: 60,000 unit

Description

The latest in benchtop SEM technology, the JCM-6000Plus "NeoScopeTM," is a touch panel controlled, multi functional desktop scanning microscope that answers the increasingly diversified needs among users worldwide. The JCM-6000Plus is equipped with the high-sensitivity semiconductor detectors found in high-end instruments, making it easy to acquire composition contrast information about the specimen, and enabling efficient analysis. The series continues to include the high-vacuum functionality and secondary electron detector, offering the ability to clearly observe fine structures on the specimen surface at high magnification.

Main features of the JEOL JCM-6000plus
Automatic image formation after sample introduction within 3 minutes
High resolution (60,000X) and large depth of field
Multi-touch screen interface for intuitive operation
Advance automatic functions (focus, stigmation, brightness/contrast)
High and low vacuum modes
Three selectable accelerating voltages
Secondary electron and solid state backscattered electron detector
Large sample coverage (up to 70 mm diameter)
Options include: motor drive stage and EDS

Other Nikon Metrology products

Industrial microscopes