Laboratory microscope ECLIPSE LV-DAF

laboratory microscope
laboratory microscope
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Technical applications
laboratory, measuring, inspection, industrial, for materials research, for forensics
benchtop, upright, compact, binocular, trinocular
Observation technique
bright field, LED fluorescence, phase contrast, polarized, dark field, in-situ, differential interference contrast
Other characteristics
high-resolution, LED illumination, automatic, high-speed, modular, with height ajustment, long working distance, ergonomic, real-time, for thin-film measurements, high-precision, high-magnification, motorized, with coaxial illumination, depth measurement


The LV-DAF delivers fast, versatile autofocus with the Hybrid Auto-Focus system, making the most of two types of auto focus systems. Combining slit projection and contrast detection auto focus, it features large focus range and fast tracking ability. A variety of observation methods are supported, including brightfield, darkfield and differential interference contrast (DIC), as well as various transparent samples. Applications •Antennae •Telecom & Electronics •Telescope optics •Mobile phones, shavers & watches Benefits & features Hybrid Auto-Focus There are two common types of auto-focus systems for microscopes: slit projection and contrast detection. Slit projection system projects a slit image and then detects the shift in the reflected light. This system is useful when a large focal range is necessary. Contrast detection system projects a slit pattern and then detects the contrast of the reflected light. This system is useful when focus accuracy is needed. This is possible because this auto-focus system is less affected by sample surface variation. Hybrid Auto-Focus combines the advantages of both systems and makes the most of their paired potential. Design The controller features the same hardware design as the LV-ECON and has a compact footprint that allows them to be stacked on each other and used anywhere. Compatibility with LV Series Microscopes The LV-DAF can be combined with other LV series products. When combined with the LV-ECON, it enables observation under the optimal conditions for each particular sample.


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