The LV-DAF delivers fast, versatile autofocus with the Hybrid Auto-Focus system, making the most of two types of auto focus systems. Combining slit projection and contrast detection auto focus, it features large focus range and fast tracking ability. A variety of observation methods are supported, including brightfield, darkfield and differential interference contrast (DIC), as well as various transparent samples.
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Benefits & features
There are two common types of auto-focus systems for microscopes: slit projection and contrast detection.
Slit projection system projects a slit image and then detects the shift in the reflected light. This system is useful when a large focal range is necessary.
Contrast detection system projects a slit pattern and then detects the contrast of the reflected light. This system is useful when focus accuracy is needed. This is possible because this auto-focus system is less affected by sample surface variation.
Hybrid Auto-Focus combines the advantages of both systems and makes the most of their paired potential.
The controller features the same hardware design as the LV-ECON and has a compact footprint that allows them to be stacked on each other and used anywhere.
Compatibility with LV Series Microscopes
The LV-DAF can be combined with other LV series products. When combined with the LV-ECON, it enables observation under the optimal conditions for each particular sample.