Test platform SATE
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Description
* 33 MHz Test Rate
* 128 ~ 512 I/O Channels
* 32 ~ 128 I2C / SPI
* 32 M vector memory for pattern SPI mode
* Per channel PMU
* 4 ~ 16 DPS or 32 ~ 128 SMU
* 32 ~ 128TMU
* One test program for multi-site
* Max.128 site parallel test for Sensor device
* User friendly Software platform
* Customized Handler interface
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