Glass surface inspection system GIS 640 R series

infraredIRFPA

Low-emissivity (Low-E) glass, designed to enhance energy efficiency in buildings, presents significant challenges for traditional infrared (IR) devices, which measure glass temperature from above as the panes exit the furnace. Commonly used for windows and facade components, Low-E glass is typically constructed as multi-pane insulating glass with a very low emissivity coating. This low emissivity complicates accurate glass temperature measurement by traditional infrared line scanner devices, as they generally target the coated side from above, leading to potential inaccuracies in temperature readings and quality control issues. The Top-Down Glass Inspection System (Top-Down GIS) has been developed to address this issue. This system aims to provide accurate temperature measurements of Low-E glass during production. Unlike the Bottom-Up GIS, which measures from beneath the glass, the Top-Down GIS measures from above while using an additional reference pyrometer from below to correct for emissivity. This dual measurement approach ensures that defective or inhomogeneous surfaces can be detected and allows for adjustments in heating or cooling based on the temperature distribution, ensuring optimal quality and consistency in glass production. Referencing from below is necessary for two reasons: the coated upper side of the glass has low emissivity, making accurate measurement difficult, and there is often insufficient space for cameras to measure from below due to the low furnace height. This setup would require more than one camera, and a wide-angle view could influence measurements differently.