Through-beam photoelectric sensor HD-T1 series

through-beam photoelectric sensor
through-beam photoelectric sensor
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Sensing mode
Type of beam
Other characteristics
compact, miniature, IP67
Maximum range

30 mm (1.2 in)


LED type wafer alignment sensor The HD-T1 series is a new wafer alignment sensor. The use of a safe LED light beam now allows for high precision detection with a resolution of 30µm. The sensor is best suited to detect wafer eccentricity, notches and orientation flats. Using linear image sensor methodology and high-speed sampling technology, a wide variety of objects can now be stably measured with great precision at ultra-high speeds. This CCD style sensor is developed for using in almost all fields of industry, e.g. tire manufacturing or semiconductor production (wafer printed circuit boards). Characteristics: • No safety measures are required • High resolution of 30µm • Easy installation • No need for beam axis alignment • Low current consumption of 70mA or less • Adjustment functions for both span and shift have been incorporated


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