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Through-beam photoelectric sensor HD-T1 series
rectangularLEDminiature

through-beam photoelectric sensor
through-beam photoelectric sensor
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Characteristics

Sensing mode
through-beam
Housing
rectangular
Type of beam
LED
Other characteristics
compact, miniature, IP67
Maximum range

30 mm (1.2 in)

Description

LED type wafer alignment sensor The HD-T1 series is a new wafer alignment sensor. The use of a safe LED light beam now allows for high precision detection with a resolution of 30µm. The sensor is best suited to detect wafer eccentricity, notches and orientation flats. Using linear image sensor methodology and high-speed sampling technology, a wide variety of objects can now be stably measured with great precision at ultra-high speeds. This CCD style sensor is developed for using in almost all fields of industry, e.g. tire manufacturing or semiconductor production (wafer printed circuit boards). Characteristics: • No safety measures are required • High resolution of 30µm • Easy installation • No need for beam axis alignment • Low current consumption of 70mA or less • Adjustment functions for both span and shift have been incorporated

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.