SEM-Raman gives you comprehensive in situ sample characterisation in a single system. Redefine convenience, efficiency and productivity by combining these two technologies.
Renishaw's structural and chemical analyser (SCA) interface brings the inVia™ Raman microscopes point measurement and mapping capabilities to scanning electron microscopes (SEM).
Raman + SEM
The inVia microscope and the SCA interface provide an in-SEM analytical technique that both complements light microscope-based Raman spectroscopy and overcomes the limitations of energy-dispersive x-ray spectroscopy (EDS), the traditional in-SEM analytical technique. With Renishaw's SEM-Raman system, you'll benefit from co-located morphological, elemental, chemical, physical and electronic analysis.
Use the SEM to generate high-resolution images of your sample and perform elemental analysis. Add the power of Raman to obtain chemical information and images. Identify materials and non-metals, even when they have the same stoichiometry.
The SCA and inVia are fully compatible with not only Raman but also photoluminescence (PL) and cathodoluminescence (CL) spectroscopies.
X-ray analysis of alluvial deposits
X-ray analysis of alluvial deposits
One combined system for co-located analysis
With one combined system, you save valuable time. You do not have to move your samples between two instruments and risk analysing the wrong sample region.
Both the inVia microscope and SEM can be operated as stand-alone systems, at the same time, without compromising the performance of either. You have a Raman system, a SEM system and a combined Raman-SEM system.