total reflection X-ray fluorescence spectrometer / optical / for analysis / automatic
for analysis, automatic
high-sensitivity, total reflection X-ray fluorescence, benchtop
The new, next generation Rigaku NANOHUNTER II benchtop total reflection X-ray fluorescence (TXRF) spectrometer enables high-sensitivity ultra-trace elemental analysis of liquids down to parts-per-billion (ppb) concentrations. Total reflection X-ray fluorescence spectroscopy is a method by which an incident beam of X-rays just grazes the sample, delivering low-background noise, high-sensitivity measurement of ultra-trace elements.TXRF for trace element environmental applicationsDue to increasingly stringent environmental regulations, there is now demand for a simpler method of conducting elemental analyses down to ppb levels for factory waste liquids and effluent streams. Using the NANOHUNTER™ II spectrometer, analysis down to the ppb level becomes possible, even with a very small sample size, merely by adding a drop of liquid to the sample carrier, drying it, and then performing the measurement. Quantitative analyses using internal standard substances can also be easily performed.Benchtop TXRF with 600 W X-ray tube powerRigaku NANOHUNTER II TXRF analyzer combines a fully automatic optical axis adjustment system that provides stable high-sensitivity analysis in an easily handled benchtop form factor that allows quick and trouble-free operation. With a high-power 600 W X-ray source, a newly developed mirror (optic) and a large-area silicon drift detector (SDD), the NANOHUNTER II TXRF spectrometer features a 16 position autosampler to take advantage of fast measurement times for high throughput.