Used for testing and calibration of aerospace inertial navigation devices/systems, defense/military equipment, research institutes, marine systems, and electronic sensors, including components such as gyroscopes, accelerometers, reaction wheels, satellite sensors, and test radar systems. It provides multi-degree-of-freedom (multi-DOF) motion and comprehensive performance testing under high/low-temperature environments for MEMS sensors, fiber optic gyros (FOG), laser gyros, and other precision devices.
Ⅱ. Features
n Functions such as position control, rate control, and oscillation control
n Slip ring counting function and overspeed protection function
n Test surface temperature control protection function
n Compatible with a temperature control chamber for environmental temperature testing
n Optional customizable fixture design for the test surface and integrated inertial device testing systems