Voltage measuring instrument ModuLab XM MTS
currentimpedanceelectrical field

voltage measuring instrument
voltage measuring instrument
voltage measuring instrument
voltage measuring instrument
voltage measuring instrument
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Characteristics

Measured value
voltage, current, impedance, electrical field, capacitance

Description

The latest generation ModuLab® XM MTS system is designed with modularity and flexibility in mind to allow for a wide range of applications. Purpose built for materials test research the ModuLab XM provides: - I-V (voltage scans with current measurement - used to characterize electronic and dielectric materials) P-E (polarization / electric field - used to run hysteresis tests to characterize ferroelectric materials) - High-speed pulse (used to activate charge carriers in electronic and dielectric materials) - Staircase and smooth stepless analog ramp waveforms - Impedance, admittance, permittivity / capacitance, electrical modulus - C-V capacitance - voltage, Mott-Schottky - Automatic sequencing of time domain and impedance/capacitance measurements ModuLab XM MTS is able to auto-sequence all of the above techniques for charge carrier activation and analysis, without changing sample connections. Temperature control is also built into the software via cryostats, furnaces and probe stations.
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.