With intrinsic jitter of less than 100 femtoseconds for extremely accurate device characterization, the DSA8300 Series provides comprehensive support for Optical Communications Standards, Time Domain Reflectometry and S-parameters. The DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155 Mb/sec to 400G PAM4
Electrical module signal measurement accuracy:
Ultra-low system jitter ( 70GHz
Industry’s lowest system noise at all bandwidths:
600 µV max (450 µV typ.) @ 60 GHz
380 µV max (280 µV typ.) @ 30 GHz
Up to 6 channels simultaneous acquisition at <100 fs jitter in a single mainframe.
Optical modules support optical compliance test of all standard rates from 155 Mb/s to 100 Gb/s (4x25) Ethernet.
Superior acquisition throughput with up to 300 kS/s maximum sample rate.
Ability to place the samplers adjacent to the device under test (DUT).
Independent calibrated channel de-skew.
<100 fs intrinsic jitter enables the characterization of high bit-rate (40 and 100 (4´25) Gb/s) devices with typically 45 Gb/sec).
Minimizes the amount of instrumentation noise when acquiring high bit-rate, low-amplitude signals to eliminate additional noise which can exhibit itself as additional jitter and eye closure.