Laser beam profiler BP209-VIS

Features High-Precision Analysis of Beam Quality and Spatial Power Distribution Single Stand-Alone Measurement Head For Characterization of Continuous or Pulsed Laser Beams with a Repetition Rate >10 Hz Scanning Speeds from 2 to 20 Hz Additional Knife-Edge Mode Power Meter Integrated (Not Calibrated) Dynamic Range of 78 dB Low Noise Amplifier 2D or Pseudo 3D Diagrams High-Speed USB 2.0 Interface to PC Thorlabs' Dual Scanning Slit Beam Profilers are ideal for analyzing laser beam profiles that have a close-to-Gaussian beam shape. For non-Gaussian beam shapes, we recommend our camera beam profilers. These scanning slit profilers allow fast, simultaneous measurements of both the X and Y profiles with a high dynamic range of 78 dB and a variable scanning speed from 2 to 20 Hz without the need of attenuators in the beam path. There are two models available, one for use with light in the 200 - 1100 nm range and a second for use with light in the 900 - 1700 nm range. Both versions are equipped with a physical aperture measuring 9 mm in diameter. This design offers two slit widths, low noise electronics, and the additional knife-edge mode, making it possible to analyze an extended range of beam diameters (2.5 µm to 9 mm) with a single device. The beam diameter is measured in accordance with the ISO11146 standard. It can be displayed using a number of industry-standard clip levels, such as 1/e2 (13.5%), 50%, or an arbitrary clip level set by the user. For details about the functionality and the usage of the different slit widths, please see the Operation tab.