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Laboratory microscope Xradia 510 versa
X-ray3Din-situ

laboratory microscope
laboratory microscope
laboratory microscope
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Characteristics

Technical applications
laboratory
Type
X-ray
Observation technique
3D, in-situ
Resolution

0.7 µm

Description

ZEISS Xradia 510 Versa Your 3D Submicron Imaging System with Breakthrough Flexibility Break the one micron resolution barrier with this X-ray microscope for 3D imaging and in situ / 4D investigations. Use the combination of resolution and contrast with flexible working distances to extend the power of non-destructive imaging in your lab. Benefit from its architecture that uses a two-stage magnification technique to achieve submicron resolution at a distance (RaaD). Reducing dependence upon geometric magnification maintains submicron resolution even at large working distances. Highlights Enjoy versatility even at large working distances from the source - from millimeters m to centimeters. Perform 3D Imaging for soft or low-Z materials with advanced absorption and innovative phase contrast Achieve world-leading resolution at flexible working distances beyond the limits of projection-based micro-CT Resolve submicrometer-scaled features for diverse sample sizes Extend non-destructive imaging in your lab with an in situ / 4D solution Investigate materials in native-like environments over time Throughput with image quality

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