ZEISS Xradia 510 Versa
Your 3D Submicron Imaging System with Breakthrough Flexibility
Break the one micron resolution barrier with this X-ray microscope for 3D imaging and in situ / 4D investigations.
Use the combination of resolution and contrast with flexible working distances to extend the power of non-destructive imaging in your lab.
Benefit from its architecture that uses a two-stage magnification technique to achieve submicron resolution at a distance (RaaD). Reducing dependence upon geometric magnification maintains submicron resolution even at large working distances.
Enjoy versatility even at large working distances from the source - from millimeters m to centimeters.
Perform 3D Imaging for soft or low-Z materials with advanced absorption and innovative phase contrast
Achieve world-leading resolution at flexible working distances beyond the limits of projection-based micro-CT
Resolve submicrometer-scaled features for diverse sample sizes
Extend non-destructive imaging in your lab with an in situ / 4D solution
Investigate materials in native-like environments over time
Throughput with image quality