In an industrial quality, failure analysis, or research environment, the scanning electron microscope (SEM) is the solution of choice for metallography and failure analysis applications, due to its ability to provide both high resolution imaging and high spatial resolution elemental chemistry.
Designed specifically for routine inspection and analysis applications, EVO can be operated by both expert and non-expert electron microscopists by means of the dedicated, simplified graphical user interface.
It delivers high quality data, especially for non-conductive parts that cannot be coated with a conductive layer due to a requirement for subsequent inspection.
EVO can be seamlessly integrated into a multi-modal workflow, thanks to features like semi-automated relocation of regions of interest and data integrity solutions – across systems, labs or even locations.
SmartPI – the ZEISS automated, standards-compliant SEM particle analysis solution that allows particle classification on the basis of elemental composition – is implemented on EVO as a turnkey solution for industrial cleanliness.
With a wide choice of chamber sizes, vacuum systems, electron emitter types, and analytical options, EVO can be matched closely to any price-performance requirements.