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Analysis microscope ZEISS SIGMA
SEMdigital camera

analysis microscope
analysis microscope
analysis microscope
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Characteristics

Technical applications
for analysis
Type
SEM
Other characteristics
digital camera

Description

The SIGMA FE-SEM (Field Emission Scanning Electron Microscopes) is a series of advanced microscopes used in detecting electrons. It comes with an image navigation software which is incorporated into SmartSEM. It is designed out of the GEMINI column giving it a low voltage imaging stability. Mounting dual EDS detectors unto its chamber will increase it functionality.

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