X-ray microscope Xradia series

laboratory3Din-situ

ZEISS Xradia 610 and 620 Versa 3D X-ray Microscopy for Faster Sub-Micron Imaging of Intact Samples Move beyond exploration to achieve your moments of discovery. Unlock new degrees of versatility for your scientific and industrial research with the most advanced 3D X-ray microscope models in the ZEISS Xradia Versa family. Building on industry-best resolution and contrast, ZEISS Xradia 610 & 620 Versa expand the boundaries of your non-destructive sub-micron scale imaging. Highlights Extending the Limits of Micro- and Nano-CT Solutions Non-destructive sub-micron scale microscopy of intact samples Higher flux and faster scans without compromising resolution True spatial resolution of 500 nm with a minimum achievable voxel size of 40 nm High resolution across a broad range of sample types, sizes, and working distances In situ imaging for non-destructive characterization of microstructures in controlled environments and over time Upgradeable and extendible with future innovations and developments Throughput with image quality