Designed for the most demanding applications, the Nexview™ NX2 3D optical profiler combines exceptional precision, advanced algorithms, application flexibility, and automation into a single package that represents ZYGO's most advanced Coherence Scanning Interferometric (CSI) profiler.
The completely non-contact technology optimizes the return on investment by delivering sub-nanometer precision at all magnifications and measuring a wider range of surfaces faster and more precisely than other comparable technologies commercially available. With applications as varied as flatness, roughness and waviness, thin films, step heights and more on virtually any surface and material, Nexview NX2 truly is the no-compromise profiler.
As the latest generation flagship, Nexview™ NX2 provides a wide range of differentiated features targeted at making users' metrology better, faster, and more reliable:
• Large-area 1.9 MP sensor with high sensitivity lets you see more in a single measurement
• High-speed measurements take only seconds for improved productivity and process control
• Automated part focus and setup minimizes operator variability and training while reducing the time to data
• Gage capable performance through exceptional precision and repeatability for the most demanding production applications.
• Vibration robust metrology with SureScan technology and built in isolation enables high quality metrology even in vibration-prone environments