Bruker nanotechnology microscopes

Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm

The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution ...

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm

... the SU7000! Versatile Imaging Capability The SU7000 excels in fast acquisition of multiple signals to address expansive SEM needs, from imaging a wide field of view to visualizing sub-nanometer structures and everything ...

Resolution: 1.2 nm

... -based system for SEM imaging that goes beyond basic preset conditions and recipes. Its ease of use opens a new gateway for material research, development, and area beyond our imagination. The SU5000 FE-SEM has forever ...

Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm

Performance & Power in a Flexible Platform Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize ...

Magnification: 6 unit - 800,000 unit
Resolution: 4, 5, 15 nm

... previously only available in a full-sized SEM. This SEM runs on clean energy for an economical analytical tool, without compromising performance. The FlexSEM 1000 II Scanning Electron Microscope features ...

Magnification: 10 unit - 25,000,054 unit
Weight: 54 kg
Length: 614, 617 mm

... innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized ...

Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm

... electron gun (Cold FEG) • Ultra-stable column and power supplies for enhanced instrument performance • Simultaneous Cs-corrected SEM & STEM imaging capability with atomic resolution • New high-stability side-entry ...

Weight: 990 kg
Width: 1,190 mm
Height: 1,800 mm

The Hitachi NP6800 is a SEM-based dedicated probing system designed to meet the analytical needs of the 10-nm design node semiconductor device and beyond. The precision piezoelectric-driven actuator is equipped with X, Y and Z axes probe ...

The Hitachi NE4000 nanoEBAC is an electron beam based probing system for electrical characterization and EBAC analysis and imaging of microelectronic device interconnects, materials, and components. Electron Beam Absorbed Current (EBAC) ...

... analyzes. Entry-level inverted microscope for general purpose applications for hardness testing. Industrial and materials science inverted microscope especially designed for opaque specimens (including ...