Jeol electron microscopes
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... Omega energy filter, a side-entry liquid nitrogen cooling stage and an automated specimen exchange system, is a cryo-electron microscope (cryo-EM) that enables observation of bio-molecules at cryo-temperature. ...
Jeol
Resolution: 0.08 nm - 0.23 nm
... atomic-resolution imaging. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit. Contrast enhancement of light elements is achieved by a new STEM ...
Jeol
Resolution: 0.19, 0.23 nm
... bright field/dark field TEM to STEM that uses a variety of detectors. The JEM-F200, with its new 4-stage probe-forming optical system, that is, Quad-Lens Condenser System, controls intensity and the ...
Jeol
Magnification: 2,000 unit - 800,000 unit
Resolution: 0.1 nm - 0.31 nm
... -2200FS, a state-of-the art analytical electron microscope, is equipped with a 200kV field emission gun (FEG) and the in-column energy filter (Omega filter) that allows a zero-loss image, where inelastic ...
Jeol
Resolution: 0.14 nm - 0.31 nm
The JEM-2100Plus is a multi purpose transmission electron microscope, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior ...
Jeol
Magnification: 10 unit - 1,500,000 unit
Resolution: 0.2, 0.14 nm
... are increasing. To meet those needs, a new 120 kV electron microscope “JEM-1400Flash” is equipped with a high-sensitivity sCMOS camera, an ultra-wide area montage system, and an OM (optical microscope) ...
Jeol
Magnification: 3,500 unit - 100,000 unit
... function which decelerates illuminated electron beam and accelerated electron signal using biased voltage for sample. New Backscattered Electron Detector The newly developed ultra ...
Jeol
Magnification: 10 unit - 2,740,000 unit
Resolution: 0.9, 1.3 nm
JSM-F100 Schottky Field Emission Scanning Electron Microscope The JSM-F100 incorporates not only our highly regarded In-lens Schottky Plus field emission electron gun and "Neo Engine" ...
Jeol
Magnification: 25 unit - 1,000,000 unit
Resolution: 1, 1.3, 3 nm
JSM-7610F is an ultra high resolution Schottky Field Emission Scanning Electron Microscope which has semi-in-lens objective lens. High power optics can provide high throughput and high performance analysis. ...
Jeol
... Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". The JCM-7000 incorporates three innovative functions; ...
Jeol
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