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X-ray inspection system
X-ray inspection system
M1

The M1 system is an economical, large-envelope modular inspection system. The perimeter frame and cantilevered sample stage allows for free and clear access around the ...

X-ray inspection system / diode array
X-ray inspection system
M2

The M2 system is a high-precision large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 8 axis manipulator. Supporting ...

X-ray inspection system
X-ray inspection system
C2

The C2 platform is a high-precision, extra large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 7-axis manipulator. Supporting ...

X-ray inspection system / high-resolution
X-ray inspection system
XT V 130C

The XT V 130C is a highly flexible and costeffective electronics and semiconductor inspection system. The system features a 130 kV/10 watt Nikon Metrology manufactured source, a globally ...

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Nikon Engineering
X-ray inspection system / automatic
X-ray inspection system
XT V 160

... making X-ray the only viable inspection solution. XT V 160 is an easy-to-use, cost-effective and high-quality PCB inspection system targeting production facilities and failure analysis ...

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Nikon Engineering
X-ray inspection system
X-ray inspection system
XT H 225, XT H225

... . XT H 225 offers a powerful micro-focus X-ray source, a large inspection volume, and high X-ray and CT imaging resolution. XT H 225 suits a wide range of applications, including inspection of small castings, ...

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Nikon Engineering
X-ray inspection system / high-resolution
X-ray inspection system
XT H 320

The XT H 320 features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects. The system consists of a 320 kV microfocus source delivering ...

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Nikon Engineering
wafer inspection system
wafer inspection system
OPTISTATION-3100/3200

... ensuring significantly better imaging. Nikon's acclaimed wide illuminator (WIL) and line illuminator (LIL) enable macro inspections under ideal conditions. Can be equipped with the newly designed DUV microscope module ...

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Nikon Engineering
manual inspection system / visual / for wafers / in-line
manual inspection system
OPTISTATION-3000

... visual inspection of 300mm wafers Contributes to dramatic increases in yields as an inline inspection system and analysis tool for R&D defect analysis. High transfer stability The ...

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Nikon Engineering