Nikon Metrology measuring systems

1 company | 7 products
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video measuring system
video measuring system
iNEXIV VMA-2520

... perfect when space is at a premium. This touch probe-ready system is ideal for a wide variety of industrial measuring, inspection and quality control applications using both vision and ...

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Nikon Metrology
video measurement system
video measurement system
NEXIV VMZ-S3020

... VMZ-S3020 offers speed and accuracy where high throughput is critical The VMZ-S3020 CNC video measurement system provides a 300mm x 200mm x 200mm (X,Y,Z) measuring envelope together ...

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Nikon Metrology
video measuring system
video measuring system
iNEXIV VMA-4540

... video metrology system provides a 450mm x 400mm x 200mm (X,Y,Z) measuring envelope together with wide field of view optics. This touch probe-ready system is ideal for a wide variety of ...

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Nikon Metrology
video measuring system
video measuring system
iNEXIV VMA-6555

The iNEXIV VMA-6555 system offers high speed, accuracy and a large measuring envelope to meet your needs The iNEXIV VMA-6555 CNC video metrology system provides a large 650mm x 550mm ...

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Nikon Metrology
video measuring system
video measuring system
NEXIV VMZ-K3040

... accurate with this system! The Confocal NEXIV can be optimally used for measurements of a variety of bump heights on advanced IC packages such as wafer-level CSP, as well as for the inspection of highly complicated structures ...

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Nikon Metrology
thickness measuring system
thickness measuring system
NEXIV VMZ-K6555

... dimensions of highly complex structures on advanced semiconductor devices, probe cards, substrate patterns on circuit boards, MEMS and a variety of other demanding applications. Key benefits Simultaneous wide-area ...

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Nikon Metrology
microscope measurement system
microscope measurement system
MM-200

The MM-200 is an affordable, compact and tough measuring microscope system with the capability for inspecting both small and medium size components across a wide range of industries, from plastic parts, ...

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Nikon Metrology