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HORIBA Jobin Yvon provides spectrometers for the surface, depth profile and bulk analysis of both conductive and non-conductive samples with Radio Frequency Glow Discharge sources (RF-GD-OES). It is an extremely fast technique and easy to operate.
GDS is the ideal tool to investigate from the surface down to more than 150 microns with a depth resolution that can be as good as 1 nm.
Patented HDD (High Dynamic range Detection) used in the HORIBA Jobin Yvon GD instruments allows real time, automatic optimization of each detector permitting to analyze elements at trace levels in one layer and as major in a second layer without compromise on sensitivity.
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