X-ray NDT inspection module
0.160 - 5 MeV | X-Scan iHE
Detection Technology
Detection Technology's X-Scan iHE is an optimized series of products for high energy industrial NDT applications. The X-Scan iHE can provide the solution for very wide range of X-ray source with optimized X-ray absorption efficiency in the high energy range from 160KV to 5 MeV.
Features
* 160 KeV - 5 MeV
* Active length from 410 mm to 1638 mm
* Pixel size options: 0.2 mm, 0.4 mm and 0.8 mm
* Integration time 0.8 ms at minimum
* 16-bit AD, Dynamic range > 8000
* Supports ethernet and frame grabber card interfaces
Benefits:
* High sensitivity and high speed for high energy NDT
* Optimized design high energy industrial NDT applications requiring high dynamic range
* Both continuous and non-continuous sources are supported.
* Cost efficient solution for high energy applications
* Customized applications available upon request
* Demo software with Ethernet interface providing a plug-and-play system
* Easy software design based on a control library and DT sample software code
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