Probe cards

FEINMETALL ViProbe® II is the next generation of ViProbe®. ViProbe® II not only includes all the advantages of the ViProbe®, but also offers a significantly increased product lifetime and additional safety features to optimally protect ...

Probe card with Lamella contact elements, especially suitable for RF applications with a high design variety. Good contacts Proven and excellent contacting quality Temperature range -55°C to 200°C Maintenance Best ...

... contact probes developed and manufactured in-house, a wide variety of customer applications can be tested. Radio frequency tests Best RF performance with solutions up to 100 GHz Temperature range -55°C to 150°C Spring ...

Adaptable to an enormous range of applications, the ViProbe® has been a proven buckling beam technology for more than 25 years, valued for its superior contacting quality and unique ease of repair. Good contacts Proven and excellent ...

... utilizing FormFactor’s Matrix architecture, HFTAP K32 probe cards can test at speeds that no other full wafer contactor can achieve. The extended capability of FormFactor’s HFTAP K32 probe ...

... Testing these new, high-performance, high-density DRAM devices is optimized with FormFactor’s Matrix and PH-Series wafer probe cards as they improve efficiency and reduce the overall cost of DRAM test. Every ...

... ramps and advanced product roadmaps, this platform extends the production-proven Matrix™ architecture to address increased probe card parallelism in excess of 3000 sites per wafer on a single touchdown. ...