Crack growth tester DCPD-U50

for metal sheets

The DCPD-U50 is a modern microprocessor based instrument for measuring crack depth in metals undergoing materials testing. Building on the success of the DCPD-U50 this new unit takes on board customer comments and suggestions, as shown in its impressive features list. It utilises the pulsed direct current potential drop method (DCPD) which is an established technique covered by the ASTM 647 standard. The technique involves passing a constant current through the metal under test and measuring the resultant voltage drop that is created across the specimen. The presence of a growing defect will alter this voltage and by suitable calibration, a measure of the defect depth can be obtained. Applications: ● Dynamic Material Test ● Strain/Stress Analysis ● Dynamic Material Elasticity Testing ● Fatigue crack initiation ● Dynamic crack growth studies ● Condition monitoring ● Crack closure studies ● Stress corrosion testing ● Slow crack growth ● Crack initiation ● Crack sizing Features ● Continuous DCPD ● Pulsed DCPD as standard ● Ultra Precision Differential signal amplifier with high bandwidth up to 10k Hz ● Gain Accuracy ± 0.1%, ● Gain : 20 ~ 50,000 by rotary switch, Accuracy 1% ● Triggering function, peak, trough, time interval and mid-point of load cycle waveform input. ● High Current O/P, up to 50A. ● Plug-in module ● Automatic bridge balance, with EEROM to preserve balance without power ● Built-in with four-pole Bessel low-pass filter with cutoff frequencies of 1 Hz, 10 Hz, 100 Hz,1k, 10k Hz and wide-band ● Variable DC offsets and auto balance for the removal of standing voltages ● Two channels as standard, reference and specimen.