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Semiconductor inspection device quality
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Characteristics
- Applications
- semiconductor
- Options
- quality
Description
CIMS add-on metrology options are designed to further enhance inspection capabilities of Semiconductor devices. Those options can be integrated with CIMS equipment offering a new layer of quality assurance for our customers.
CIMS add-on options include unique 2D and 3D metrology capabilities allow to perform advanced measurements during the normal inspection cycle. This eliminates the need for an offline dedicated metrology systems and shortens QA feedback cycle.
Other CIMS products
Semiconductors Inspection and Metrology
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.
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